AAS 205th Meeting, 9-13 January 2005
Session 66 The SNAP Focal Plane: Spectrograph and Imager
Poster, Tuesday, January 11, 2005, 9:20am-6:30pm, Exhibit Hall

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[66.02] A General Purpose Optical Instrument SImulation Package; Application to the SNAP Integral Field Spectrometer

A. Bonissent (CPPM/CNRS, France), SNAP Simulation Group Collaboration

A pixel level simulation software is described. It is composed of two modules. The first module applies Fourier optics at each active element of the system to construct the psf at a large variety of wavelengths and spatial locations of the point source. The input is provided by the engineer,s design program (Zemax) in the form of Zernike coefficients and discrete positions. It describe the optical path and the distorsions. The psf properties are compressed and interpolated using shapelets decomposition and neural network techniques. A second module is used for production jobs. It uses the output of the first module to reconstruct the relevant psf and integrate it on the detector pixels. Extended and polychromatic sources are approximated by a combination of monochromatic point sources. Application to the integral field spectrometer is presented. A separate poster presents the application to a slitless grism based instrument.

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