AAS 204th Meeting, June 2004
Session 75 Surveys, Catalogs and Databases
Poster, Thursday, June 3, 2004, 9:20am-4:00pm, Ballroom

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[75.01] Bias-Corrected Chandra Multiwavelength Project (ChaMP) X-ray Log(N)-Log(S) Relation

M. Kim, D.-W. Kim, B. J. Wilkes, P. J. Green, R. A. Cameron, J. D. Silverman (Smithsonian Astrophysical Observatory), ChaMP Collaboration

We present X-ray Log(N)-Log(S) relations which are corrected the incompleteness and Eddington bias and which are deeper by a factor of a few than the first ChaMP results in Kim et al. (2004). To quantitatively characterize the sensitivity and completeness as a function of source flux, off-axis distance and background level, we have performed a large set of simulations. We have simulated ~13,000 artificial X-ray sources per deg2, added them to each Chandra observation in the ChaMP sample and run the same procedures of detection and source extraction as in the ChaMP data processing. We compare our ChaMP results with those of Chandra deep fields and search for the statistically significant field-to-field variation of the cosmic background source density.

This work is supported in part by NASA grant AR4-5017X (Chandra).

The author(s) of this abstract have provided an email address for comments about the abstract: mkim@cfa.harvard.edu

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