34th Solar Physics Division Meeting, June 2003
Session 20 Instrumentation
Poster, Wednesday, June 18, 2003, 3:30-5:00pm, Mezzanine

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[20.06] Expected Performance of the Extreme Ultraviolet Imaging Spectrometer on Solar-B

J.T. Mariska, C.M. Brown, K.P. Dere, G.A. Doschek, C.M. Korendyke, S.H. Myers, J.F. Seely (NRL), J.L. Culhane (MSSL), T. Watanabe (NAOJ)

The Extreme Ultraviolet Imaging Spectrometer (EIS) is currently under development for flight on the Japanese Solar-B satellite. EIS uses a multilayer-coated off-axis telescope mirror and a multilayer-coated toroidal grating spectrometer to produce stigmatic spectra of solar regions isolated by a 1024 arcsec high slit. The instrument produces monochromatic images either by rastering the solar image across a narrow entrance slit or by using a very wide slit. Half of each optic is coated to optimize reflectance at 19.5 nm, and the other half to optimize reflectance at 27.0 nm, with each wavelength range imaged onto a separate CCD detector.

In this presentation we provide an update on the EIS hardware development and show details of the expected performance of the instrument in solar quiet regions, active regions, and flares.

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Bulletin of the American Astronomical Society, 35 #3
© 2003. The American Astronomical Soceity.