HEAD 2003 Meeting
Session 14. Cosmic X-ray Background and Deep Surveys III
Poster, Sunday-Wednesday, March 23, 2003, Duration of Meeting

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[14.02] Chandra Multi-wavelength Plane (ChaMPlane) Survey: Initial Results for X-ray Source Properties

J Hong, J.E. Grindlay, S. Laycock, P. Zhao, D. Kim, E. Schlegel (Harvard-Smithsonian Center for Astrophysics, 60 Garden St., Cambridge, MA 02138)

We present initial results of X-ray source properties from 60 fields surveyed by Chandra Multi-wavelength Plane (ChaMPlane) project. ChaMPlane is our ongoing deep galactic plane survey with the Chandra X-ray observatory. These 60 Chandra fields are selected for galactic latitude < ~ 12 deg, exposure > ~ 20 ksec and lack of bright diffuse or point sources, and 30 of them are in the Galactic Center region reported by Wang et al (2002, Nature, 415, 148). We report the properties of the X-ray sources in these fields and compare them, as well as the logN-logS distributions, with the recent results from our first discussion of ChaMPlane sources (Grindlay et al 2003, AN, in press) and a deep observation of the Galactic center (Muno et al. 2003, ApJ submitted). We processed the data and identified the sources using tools specifically developed for the high latitude ChaMP survey but with modifications to enable processing stacked images from multiple observations of the same field. We access source reliability and positional uncertainty through simulations. The significantly enhanced logN-logS distribution reported for the galactic bulge by Grindlay et al is mapped in finer detail and compared with the sharp central peak at the galactic center. The X-ray color-color analysis suggests that the excess in the galactic bulge is likely due to an enhanced population of CVs and compact binaries. This work was supported in part by NASA/Chandra grants AR1-2001X and AR2-3002A and NSF grant AST-0098683.

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Bulletin of the American Astronomical Society, 35#2
© 2003. The American Astronomical Soceity.