AAS 200th meeting, Albuquerque, NM, June 2002
Session 63. Future Airborne and Space Instruments
Display, Wednesday, June 5, 2002, 10:00am-7:00pm, SW Exhibit Hall

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[63.04] Error Analysis of Photometry in SIM

X. Pan (JPL)

SIM provides accurate phase measurements of 10-5 precision in order to reach a micro-arc-second accuracy for astrometry. The instrument also can make good measurements of photometry over wide wavelength coverage. In particular, it is possible to do differential photometry for precision of 0.3 Characteristics and differences between classic photometry and SIM photometry are discussed. A detailed descriptions of two photometers in SIM are presented and compared. The interferometric results of photometry from the MarK III interferometer are presented. The error sources of photometric measurements in SIM will be discussed, and the strategy of photometric measurements in SIM will be investigated.

This work is supported under contract with the National Aeronautics and Space Administration.

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Bulletin of the American Astronomical Society, 34
© 2002. The American Astronomical Soceity.