AAS 205th Meeting, 9-13 January 2005
Session 66 The SNAP Focal Plane: Spectrograph and Imager
Poster, Tuesday, January 11, 2005, 9:20am-6:30pm, Exhibit Hall

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[66.05] Optical Characterization of 1.7 micron NIR Detectors for SNAP

M. G. Brown (University of Michigan), SNAP Collaboration

Precision photometry at the ~2% level is a critical driver for the NIR detector system specifications for SNAP. A complete understanding of the quantum efficiency as a function of wavelength, time and temperature is an important element for the calibration of the NIR detector system. We have begun to characterize short-wave NIR detectors for SNAP produced by Rockwell Science Center and by Raytheon Vision Systems. We present initial results on quantum efficiency for some prototype devices. Since SNAPís images will be under-sampled, intra-pixel variation can have a significant impact on photometry. Therefore we have implemented a precision NIR micron-size spot projection system that we have used to characterize the intra-pixel variation. Linearity and stability are additional factors which we are investigating that could have an important impact on precision photometry. We compare our results to the current SNAP NIR specifications and discuss our plans for developing a SNAP NIR science grade device.


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