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J.P. Grimes, P. Green, T. Gaetz (Harvard-Smithsonian CfA), S. Mathur (Ohio State University), S.N. Virani (Harvard-Smithsonian CfA), ChaMP Collaboration
The Chandra X-ray Observatory's unprecedented ~.5\arcsec angular resolution and sensitivity are ideal for the discovery and study of faint X-ray sources. The Chandra Multiwavelength Project (ChaMP) augments Chandra data with optical imaging and spectroscopy to fully investigate the properties of these sources.
We use analytical models of the Chandra mirror and ACIS instrument performance to find the source sensitivity limits as a function of off-axis angle for a given source powerlaw index and column density. By assuming an AGN X-ray luminosity function (XLF) and using a subset of Chandra Cycle 1 fields selected for the ChaMP, we then calculate the number of X-ray sources we expect to detect. We test the validity of our analytical models via Monte Carlo and ray-tracing simulations of ACIS images for typical fields.
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