HEAD 2000, November 2000
Session 26. Deep Surveys
Display, Wednesday, November 8, 2000, 8:00am-6:00pm, Bora Bora Ballroom

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[26.08] The ChaMP: A Raytrace Investigation of the Chandra Sensitivity Limits

T. J. Gaetz, D. Jerius, J. P. Grimes, P. Green, S. N. Virani, H. Tananbaum, B. Wilkes (Harvard-Smithsonian CfA), ChaMP Collaboration

The Chandra\/ X-ray Observatory provides high sensitivity and high angular resolution, minimizing the possibility of source confusion. This makes it an ideal instrument for investigation of the properties of the X-ray background sources, and the Chandra\/ Multiwavelength Project (ChaMP) will exploit these capabilities to obtain a uniformly processed sample of background objects. An important component of these studies will be understanding the detection biases in the survey.

In the course of calibrating the Chandra\/ X-ray optics, a high-fidelity raytrace model of the performance of the optics was developed. To examine the telescope response to faint sources, we combine this raytrace model with the Chandra MARX\/ simulator (to model the detector performance) in order to examine the telescope response to faint sources. This allows us to examine detection efficiency for synthetic data sets with varying distribution of properties, e.g.\/, source density, intensity, and spectrum.

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