HEAD 2000, November 2000
Session 26. Deep Surveys
Display, Wednesday, November 8, 2000, 8:00am-6:00pm, Bora Bora Ballroom

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[26.04] The Chandra Multi-wavelength Project (ChaMP): X-ray Data Analysis

D.-W. Kim, R. Cameron, J. Drake, A. Fruscione, T. J. Gaetz, M. Garcia, P. J. Green, J. Grimes, V. Kashyap, A. Prestwich, E. Schlegel, A. Vikhlinin, S. N. Virani, B. Wilkes, H. Tananbaum (SAO), D. Freedman (Princeton U.), ChaMP Collaboration

We present step-by-step X-ray data analysis procedures as part of the Chandra Multi-wavelength Project. They consist of additional data corrections and data screening post CXC Standard Data Processing Rev 1 and the determination of sources and their X-ray properties. Using 3 deep ACIS imaging fields (MS 1137.5+6625, CL0848.6+4453 and A0620-00) with exposure times ranging from 50 ks to 190 ks, we discuss in particular gain correction, aspect correction, removing bad pixels and node boundaries, removing ACIS flaring pixels, streak correction for the S4 chip and excluding high background intervals. Optimal parameters for source detection and X-ray source properties such as X-ray colors are also discussed.

The author(s) of this abstract have provided an email address for comments about the abstract: kim@cfa.harvard.edu

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