AAS 196th Meeting, June 2000
Session 52. Ground Based Instrumentations
Display, Thursday, June 8, 2000, 9:20am-4:00pm, Empire Hall South

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[52.10] Measurements of the Sub-pixel Sensitivity for a Backside Illuminated CCD

A. Piterman, Z. Ninkov (Center for Imaging Science, RIT)

This poster presents results from a measurements program designed to investigate the variations in sensitivity of focal plane arrays on a sub-pixel scale. Previously reported measurements have been made on front illuminated CCD devices (Kavaldjiev and Ninkov [1998] Optical Engineering). New measurements have now been made to provide information on sensitivity variations with a single pixel of a backside illuminated CCD. The measurements were made using a stable broadband light source and two high-precision translation stages. The pixel scans have been performed using 4 filters (3 broadband and 1 narrowband). The results for each spectral region will be presented. This work was supported in part by funding from the NSF, the S/UICRC program, and the New York State CAT program.

The author(s) of this abstract have provided an email address for comments about the abstract: axp0069@rit.edu

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