HEAD Division Meeting 1999, April 1999
Session 17. Missions and Instruments
Poster, Tuesday, April 13, 1999, 8:30am-6:02pm, Gold Room

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[17.21] In situ measurement of the sub-pixel structure in ACIS CCDs

M. Pivovaroff, S. Kissel, G. Prigozhin, M. Bautz, G. Ricker (MIT)

As part of our calibration of ACIS, the AXAF CCD Imaging Spectrometer, we have refined a technique that uses a thin metal film with small, periodically spaced holes to restrict incident photons to well-defined regions of the pixel, providing a way to probe sub-pixel structure. Studying the sub-pixel structure of CCDs is crucial for accurately modeling their absolute detection efficiency and for understanding the structure present in their spectral redistribution function. These experiments also demonstrate the ability to resolve source location on sub-pixel scales, which holds promise for fully utilizing the spatial resolution capabilities of Chandra with ACIS.


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